The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Sep. 29, 2015
Applicant:

Mitsui Chemicals Tohcello, Inc., Chiyoda-ku, Tokyo, JP;

Inventors:

Daisuke Matoba, Utsunomiya, JP;

Masako Kidokoro, Koga, JP;

Akira Nomoto, Koga, JP;

Aiko Shimakage, Oyama, JP;

Assignee:

MITSUI CHEMICALS TOHCELLO, INC., Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61J 1/10 (2006.01); B32B 1/02 (2006.01); B65D 77/04 (2006.01); A61J 1/00 (2006.01); B65D 65/42 (2006.01); B32B 27/08 (2006.01); B65D 65/40 (2006.01); B32B 9/00 (2006.01); B32B 27/06 (2006.01); C08J 7/04 (2006.01); C08J 7/06 (2006.01);
U.S. Cl.
CPC ...
A61J 1/00 (2013.01); A61J 1/10 (2013.01); B32B 1/02 (2013.01); B32B 9/005 (2013.01); B32B 27/06 (2013.01); B32B 27/08 (2013.01); B65D 65/40 (2013.01); B65D 65/42 (2013.01); B65D 77/04 (2013.01); C08J 7/045 (2013.01); C08J 7/06 (2013.01); B32B 2439/80 (2013.01); C08J 2323/08 (2013.01); C08J 2367/02 (2013.01); C08J 2427/08 (2013.01); C08J 2429/04 (2013.01); C08J 2433/02 (2013.01); C08J 2475/04 (2013.01);
Abstract

A laminate film includes a substrate layer; and a metal oxide layer which is provided on one surface or both surfaces of the substrate layer and contains a metal oxide. Further, the oxygen permeability measured under defined conditions is 20 ml/m·day·MPa or less and the water vapor permeability measured under conditions of a temperature of 40° C. and a humidity of 90% RH is 2.5 g/m·day or greater. In addition, when the Kα beam intensity of a metal constituting the metal oxide which is obtained by performing fluorescence X-ray analysis on the metal oxide layer is set to A and the Kα beam intensity of the metal which is obtained by performing fluorescence X-ray analysis on a metal layer formed of the metal constituting the metal oxide is set to B, A/B is equal to or greater than 0.20 and equal to or less than 0.97.


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