The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2019
Filed:
Jun. 30, 2015
General Electric Company, Schenectady, NY (US);
Darin Robert Okerlund, Waukesha, WI (US);
Mark Vincent Profio, Waukesha, WI (US);
Christine Carol Hammond, Waukesha, WI (US);
John Irvin Jackson, Brookfield, WI (US);
Judy Marie Graney, Mukwonago, WI (US);
Chelsey Amanda Lewis, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
Systems and methods are provided that acquire image data of a first location of a region of interest (ROI) when located in a field of view of a medical imaging system as a contrast material injected into the ROI passes through the first location. The systems and methods further determine from the image data of the first location when a first contrast metric is reached, and after determining the image data of the first location, position the second location of the ROI in the field of view of the medical imaging system. The systems and methods further acquire image data of the second location as the contrast material passes through the second location, and determine from the image data of the second location when the contrast material reaches a second contrast metric.