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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10349049 B1

PDFFull Text
Date of Patent:
Jul. 09, 2019

Filed:

Aug. 11, 2015

Inspecting organic tft array using differential image

Applicant:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Junya Tsutsumi, Tsukuba, JP;

Satoshi Matsuoka, Tsukuba, JP;

Toshikazu Yamada, Nagoya, JP;

Tatsuo Hasegawa, Tsukuba, JP;

Assignee:

NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;

Attorney:

Fenwick & West LLP

Primary Examiner:

Douglas X Rodriguez

Int. Cl.
CPC ...
H04N 17/00 (2006.01); G01M 11/00 (2006.01); G02F 1/1368 (2006.01); G09F 9/00 (2006.01); H01L 29/786 (2006.01); H01L 29/808 (2006.01); H01L 29/812 (2006.01); H01L 27/28 (2006.01); H01L 51/00 (2006.01); G02F 1/1362 (2006.01); H01L 51/05 (2006.01);
U.S. Cl.
CPC ...
H04N 17/004 (2013.01); G01M 11/00 (2013.01); G02F 1/1368 (2013.01); G09F 9/00 (2013.01); H01L 27/283 (2013.01); H01L 29/786 (2013.01); H01L 29/808 (2013.01); H01L 29/812 (2013.01); H01L 51/0031 (2013.01); G02F 2001/136254 (2013.01); H01L 51/0508 (2013.01); H01L 51/0541 (2013.01); H01L 51/0545 (2013.01);
Abstract

To provide an inspection device and an inspection method which are capable of detecting a disconnection defect in an organic TFT array and/or evaluating a variation in the output properties and response speed of each organic TFT element. There are provided a device and a method of optically measuring the presence or absence of the accumulation of carriers in an organic semiconductor thin film which provides a channel layer of an organic TFT element. A source and a drain in each organic TFT are short-circuited to each other, a voltage is turned on and turned off in a predetermined period between this and a gate, and images before and after application of the voltage are captured in synchronization with the predetermined period while radiating monochromatic light, to obtain a differential image.

Find Patent Forward Citations

Tsutsumi, Junya. (2019). Inspecting organic tft array using differential image (U.S. Patent No. 10349049). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10349049

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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