The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Mar. 31, 2015
Applicant:

Ams Sensors Singapore Pte. Ltd., Singapore, SG;

Inventors:

Moshe Doron, San Francisco, CA (US);

Ohad Meitav, Sunnyvale, CA (US);

Markus Rossi, Jona, CH;

Dmitry Ryuma, San Francisco, CA (US);

Alireza Yasan, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/25 (2018.01); H04N 5/225 (2006.01); H04N 5/33 (2006.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
H04N 13/25 (2018.05); G06T 7/521 (2017.01); G06T 7/596 (2017.01); H04N 5/2256 (2013.01); H04N 5/332 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10048 (2013.01); H04N 2213/003 (2013.01);
Abstract

The present disclosure describes structured-stereo imaging assemblies including separate imagers for different wavelengths. The imaging assembly can include, for example, multiple imager sub-arrays, each of which includes a first imager to sense light of a first wavelength or range of wavelengths and a second imager to sense light of a different second wavelength or range of wavelengths. Images acquired from the imagers can be processed to obtain depth information and/or improved accuracy. Various techniques are described that can facilitate determining whether any of the imagers or sub-arrays are misaligned.


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