The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Nov. 16, 2015
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Jianjun Wang, West Hartford, CT (US);

Biao Zhang, West Hartford, CT (US);

Carlos Martinez, South Windsor, CT (US);

Carlos W. Morato, Avon, CT (US);

Remus Boca, Simsbury, CT (US);

Assignee:

ABB Schweiz AG, Baden, CH;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/73 (2017.01); H04N 5/232 (2006.01); H04N 13/204 (2018.01);
U.S. Cl.
CPC ...
H04N 13/204 (2018.05); G06K 9/00791 (2013.01); G06T 7/75 (2017.01); H04N 5/232 (2013.01); G06K 9/00201 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30252 (2013.01);
Abstract

Automatic scanning and representing an environment having a plurality of features, for example, includes scanning the environment along a scanning path, interspersing a plurality of localized scanning of the plurality of features in the environment during the scanning along the scanning path of the environment wherein the interspersed localized scanning of the plurality of features in the environment being different from the scanning the environment along the scanning path, and obtaining a representation of at least a portion of the environment based on the scanning of the environment and the interspersed localized scanning of the plurality of features in the environment.


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