The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Sep. 04, 2018
Applicant:
Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Inventors:
Francois Beato, Fontaine, FR;
Agustin Palacios Laloy, Grenoble, FR;
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/06 (2006.01); H01S 5/0687 (2006.01); H01S 5/024 (2006.01); G01R 33/26 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0687 (2013.01); H01S 5/02415 (2013.01); G01R 33/26 (2013.01);
Abstract
The invention relates to the controlling of the wavelength of a laser () on an atomic transition. It in particular proposes a method comprising the steps consisting in: According to the invention, the supplying of energy to the atoms of the atomic vapour is modulated to carry out the alternating of a first phase and of a second phase, the first phase supplying more energy than the second phase.
Beato, Francois. (2019). Optical measurement system with stabilised davll control (U.S. Patent No. 10348054). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10348054
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile