The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Nov. 20, 2017
Applicants:

Tsinghua University, Beijing, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Yu-Dan Zhao, Beijing, CN;

Yu-Jia Huo, Beijing, CN;

Xiao-Yang Xiao, Beijing, CN;

Ying-Cheng Wang, Beijing, CN;

Tian-Fu Zhang, Beijing, CN;

Yuan-Hao Jin, Beijing, CN;

Qun-Qing Li, Beijing, CN;

Shou-Shan Fan, Beijing, CN;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/05 (2006.01); H01L 29/786 (2006.01); H01L 21/285 (2006.01); H01L 27/12 (2006.01); H01L 27/32 (2006.01); H01L 51/00 (2006.01); H01L 29/16 (2006.01); H01L 29/24 (2006.01); H03K 19/094 (2006.01); H01L 27/06 (2006.01);
U.S. Cl.
CPC ...
H01L 51/0558 (2013.01); H01L 21/2855 (2013.01); H01L 27/124 (2013.01); H01L 27/1218 (2013.01); H01L 27/1259 (2013.01); H01L 27/3262 (2013.01); H01L 29/1606 (2013.01); H01L 29/24 (2013.01); H01L 29/7869 (2013.01); H01L 29/78681 (2013.01); H01L 51/0023 (2013.01); H01L 51/0026 (2013.01); H01L 51/055 (2013.01); H01L 51/0516 (2013.01); H01L 51/0525 (2013.01); H01L 27/0688 (2013.01); H01L 51/0048 (2013.01); H03K 19/094 (2013.01);
Abstract

The disclosure relates to a logic circuit. The logic circuit includes two ambipolar thin film transistors. Each of the two ambipolar thin film transistors includes a substrate; a semiconductor layer located on the substrate and including nano-scaled semiconductor materials; a source and a drain, wherein the source and the drain are located on the substrate, spaced apart from each other, and electrically connected to the semiconductor layer; a dielectric layer located on the substrate and covering the semiconductor layer, wherein the dielectric layer includes a normal dielectric layer and an abnormal dielectric layer stacked on one another, and the abnormal dielectric layer is an oxide dielectric layer grown by magnetron sputtering; and a gate in direct contact with the abnormal dielectric layer. The two ambipolar thin film transistors share the same substrate, the same gate, and the same drain.


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