The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Aug. 20, 2018
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Thoralf Kautzsch, Dresden, DE;

Heiko Froehlich, Radebeul, DE;

Maik Stegemann, Pesterwitz, DE;

Mirko Vogt, Dresden, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/02 (2006.01); H01L 31/0232 (2014.01); H01L 31/0203 (2014.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H01L 31/02327 (2013.01); H01L 27/146 (2013.01); H01L 27/14618 (2013.01); H01L 27/14629 (2013.01); H01L 31/0203 (2013.01); H01L 31/02016 (2013.01);
Abstract

An optical system and photo sensor pixel are provided. The photo sensor pixel includes a substrate including an active region and a peripheral region that is peripheral to the active region, an optical sensor disposed at the active region of the substrate and configured to receive light and output a measurement signal based on the received light, and an encapsulation layer disposed over the active region and the first peripheral region of the substrate. The encapsulation layer includes at least one subwavelength-based graded index structure provided over the peripheral region of the substrate, and the subwavelength-based graded index structure is configured to redirect the light from a region over the peripheral region onto the optical sensor.


Find Patent Forward Citations

Loading…