The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Mar. 08, 2018
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Naotaka Kubota, Chino, JP;

Takeshi Koshihara, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/08 (2006.01); H01L 35/24 (2006.01); H01L 51/00 (2006.01); H01L 27/32 (2006.01); H01L 51/52 (2006.01); H01L 51/56 (2006.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
H01L 27/322 (2013.01); H01L 27/3272 (2013.01); H01L 51/0031 (2013.01); H01L 51/5237 (2013.01); H01L 51/5253 (2013.01); H01L 51/56 (2013.01); G02B 27/0172 (2013.01);
Abstract

An organic EL device as an electrooptical device includes an organic EL element, a sealing member, a color filter, a dimension evaluation pattern, and a pedestal member. The organic EL element is disposed for each subpixel, in a display area of a base as a substrate. The sealing member includes a sealing layer that covers the organic EL element. The color filter is provided on the sealing layer. The dimension evaluation pattern is provided as an evaluation pattern for evaluating the color filter. The pedestal member is disposed between an end portion of the base and the sealing member. The dimension evaluation pattern is disposed on the pedestal member.


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