The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Jan. 18, 2018
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Steven C. H. Hung, Sunnyvale, CA (US);

Johanes S. Swenberg, Los Gatos, CA (US);

Wei Liu, San Jose, CA (US);

Houda Graoui, Gilroy, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/28 (2006.01); H01L 21/321 (2006.01); H01L 29/49 (2006.01); H01L 21/285 (2006.01); H01L 21/67 (2006.01); H01L 29/51 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28088 (2013.01); H01L 21/321 (2013.01); H01L 29/4966 (2013.01); H01L 21/28568 (2013.01); H01L 21/67017 (2013.01); H01L 21/67167 (2013.01); H01L 29/513 (2013.01); H01L 29/517 (2013.01);
Abstract

A sequential plasma process is employed to enable the modification of the work function of a p-type metal layer in a metal gate structure. The sequential plasma process includes a plasma hydrogenation and a plasma process that includes electronegative species. The sequential plasma process is performed on a p-type metal layer in a film stack, thereby replacing suboxides and/or other non-stoichiometrically combined electronegative atoms disposed on or within layers of the film stack with stoichiometrically combined electronegative atoms, such as O atoms. As a result, the work function of the p-type metal layer can be modified without changing a thickness of the p-type metal layer.


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