The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Dec. 18, 2014
Applicant:

Halliburton Energy Services, Inc., Houston, TX (US);

Inventors:

Corbin Sean Glenn, Burleson, TX (US);

Zhenyu Xue, Sugar Land, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01V 5/04 (2006.01); G01V 5/12 (2006.01); G01N 23/04 (2018.01); G06T 7/90 (2017.01); E21B 43/117 (2006.01); E21B 47/00 (2012.01); F42B 35/00 (2006.01); E21B 43/267 (2006.01); F42B 33/02 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); E21B 43/117 (2013.01); E21B 43/267 (2013.01); E21B 47/0002 (2013.01); F42B 35/00 (2013.01); G01N 23/04 (2013.01); G01V 5/04 (2013.01); G01V 5/12 (2013.01); G06T 7/90 (2017.01); F42B 33/025 (2013.01); F42B 33/0214 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10116 (2013.01);
Abstract

A non-destructive inspection method that comprises obtaining one or more images corresponding to an X-ray, scanning electron microscope, or CT scan of an object, assigning numeric values to pixels of the images, comparing the numeric values to reference numeric values, and identifying an anomaly in the object based on the comparison. A non-destructive inspection system that comprises at least one processor, a memory in communication with the processor and storing instructions that causes the processor to obtain an image corresponding to an X-ray, scanning electron microscope, or CT scan of an object, assign numeric values to pixels of the image, compare the assigned numeric values to reference numeric values, and identify an anomaly in the object based on the comparison.


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