The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Sep. 10, 2015
Applicant:
Cyberoptics Corporation, Golden Valley, MN (US);
Inventors:
Eric P. Rudd, Hopkins, MN (US);
Carl E. Haugan, St. Paul, MN (US);
Assignee:
CyberOptics Corporation, Golden Valley, MN (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G06T 7/00 (2017.01); G06T 7/521 (2017.01); G06T 7/586 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01B 11/2545 (2013.01); G06T 7/521 (2017.01); G06T 7/586 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/30141 (2013.01); G06T 2207/30152 (2013.01);
Abstract
A computer-implemented method of and system for measuring a three-dimensional surface are provided. The method includes projecting structured illumination on the surface and acquiring a plurality of sets of images. The sets of images are processed to obtain a plurality of point clouds. A spatial accumulator is defined. A first point cloud of the plurality of point clouds is combined with a second point cloud of the plurality of point clouds into the spatial accumulator. Spatial coordinates of the surface are generated based on the contents of the spatial accumulator.