The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
May. 10, 2016
Jpmorgan Chase Bank, N.a., New York, NY (US);
John Tang, Long Island City, NY (US);
Rajesh L. Tolani, Upper Saddle River, NJ (US);
Jeremy M. Dobrick, New York, NY (US);
Frank Joseph Van Hoof, Ringwood, GB;
Ciaran A. Kelly, Dublin, IE;
Kirk Trivett, Hornchurch, GB;
David C. Bertram, London, GB;
Christine Duggan, Warwick, NY (US);
Jayant V. Gokhale, Edison, NJ (US);
Benjamin F. Sylvester, III, Darien, CT (US);
JPMorgan Chase Bank, N.A., New York, NY (US);
Abstract
Systems and methods for hierarchical dual-dynamic exception management are disclosed. In one embodiment, the system and method may provide: (1) hierarchical exception modelling, metric algorithms and aggregation; (2) node level exception metric algorithm and high-level status algorithm calculation; (3) node level investigation via 'explain' of exception factors (e.g., focusing an analyst on a particular issue); (4) node level tracking workflow management through ability to add commentary, multiple-person signoff, and high-level status calculation overrides; (5) visibility, auditable compliance reporting; (6) dashboard for internal operational analysts/managers with full investigation view; (7) dashboard for external clients with sub views; (8) generic data interface to existing workflow management system; and (9) machine learning component such that the exception metric can be intelligently re-adjusted (for example, if there are too many false positives then make the thresholds more forgiving). Other features and/or advantages may be provided as is necessary and/or desired.