The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Sep. 28, 2015
International Business Machines Corporation, Armonk, NY (US);
Samuel Scott Adams, Rutherfordton, NC (US);
Robert R. Friedlander, Southbury, CT (US);
James R. Kraemer, Santa Fe, NM (US);
Kelly Grant Lee, Eden Prairie, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Automatically create abstractions of large sets of data and then probabilistic inferences based on the abstractions. The probabilistic inference is derived from the logical hierarchy using Bayesian statistics to infer a probabilistic event based upon a characteristic of the data in a hierarchy of synthetic events. The logical hierarchy of a set of a plurality of synthetic events is related by at least one characteristic of data is built by accessing a first set of data. The first set of data is organized based on a first characteristic. A second set of data different than the first set of data is accessed. A second set of data based is organized based on a second characteristic. The first characteristic and the second characteristic are processed to generate a synthetic event. The synthetic event is a third set of data representing a result of a mathematical computation defined by an operation S(p)==>F(p).