The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Feb. 24, 2014
Applicant:

Nec Corporation, Minato-ku, Tokyo, JP;

Inventor:

Masanao Natsumeda, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06N 7/00 (2006.01); G06F 11/34 (2006.01); G05B 23/02 (2006.01); G06F 11/07 (2006.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G05B 23/0221 (2013.01); G06F 11/006 (2013.01); G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/34 (2013.01); G06F 11/3447 (2013.01); H04L 41/0631 (2013.01); H04L 41/147 (2013.01); H04L 43/08 (2013.01);
Abstract

In invariant relation analysis, a correlation model having high abnormality detection ability is generated. A system analysis device () includes a correlation function storage unit (), and a correlation function extraction unit (). The correlation function storage unit () stores a plurality of candidates for a correlation function expressing a correlation for each pair of metrics in a system. The correlation function extraction unit () extracts a correlation function from a plurality of candidates for a correlation function as a correlation function for each pair of metrics, on the basis of a detection sensitivity indicating a likelihood of correlation destruction caused at the time of abnormality of a metric associated with a correlation function.


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