The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Oct. 26, 2017
Hitachi, Ltd., Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In some examples, a system may train a false positive reduction machine learning model (MLM) for nodule detection. The system may receive training data images including negative images and positive images, along with an indication of nodule locations in the positive images. The system may determine elliptical approximations for nodules in the positive images, and may determine respective binarized contours from the elliptical approximations. Further, the system may determine an elliptical approximation space for the binarized contours, and may determine a subspace angle between individual image samples in the positive images and the elliptical approximation space as at least one feature of the MLM. Subsequently, when applying the MLM during nodule detection, one or more images may be input to the MLM to determine whether an indication of a nodule is correct, and if so, a visualization of a location of the nodule may be provided.