The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Dec. 20, 2016
Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto-fu, JP;
Yuki Matsuno, Nagaokakyo, JP;
Teruhisa Tsuru, Nagaokakyo, JP;
MURATA MANUFACTURING CO., LTD., Nagaokakyo-Shi, Kyoto-Fu, JP;
Abstract
Upper and lower limits of predetermined characteristic values of products contained in a plurality of product lots are stored in accordance with the product standard for a target product. An average value of standard deviations in the characteristic values is calculated based on a control chart for the product lots. An average value of the characteristic values is calculated, and an upper limit and a lower limit of an average value of the characteristic values in a 95% confidence interval is calculated. A measurement standard deviation representing a variation in a measuring instrument with regard to the characteristic values is estimated. One of an upper limit and a lower limit of the average value of the characteristic values in the confidence interval is updated as an average value of the characteristic values. A standard deviation in the characteristic values of the product is estimated, and an upper defect rate and a lower defect rate are calculated, so that a yield rate is calculated.