The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Oct. 14, 2016
Applicant:

Trifacta Inc., San Francisco, CA (US);

Inventors:

Jeffrey Heer, Seattle, WA (US);

Lars Grammel, Berlin, DE;

Sean Philip Kandel, San Francisco, CA (US);

Philip John Vander Broek, San Francisco, CA (US);

Assignee:

Trifacta Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01); G06F 16/26 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/26 (2019.01); G06F 16/252 (2019.01);
Abstract

A system provides data profile information describing attributes of a dataset. The system determines relative frequency of occurrences of attribute values with respect to a set of bins from a histogram of another attribute. The system presents a user interface that presents statistical information describing attributes of a dataset based on the relative frequency of occurrences of attribute values. The system generates a transformation script based on the user interactions for transforming records of the dataset. The transformation script is configured to preprocess data of the dataset for further analysis.


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Heer, Jeffrey. (2019). Data profiling of large datasets (U.S. Patent No. 10346421). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10346421

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