The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Jun. 27, 2016
Applicant:

Altera Corporation, San Jose, CA (US);

Inventors:

Si Xing Saw, Bukit Mertajam, MY;

Seng Kuan Yeow, Pokok Sena, MY;

Kang Syn Ting, Bayan Lepas, MY;

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/36 (2006.01); H04L 7/00 (2006.01); G06F 13/362 (2006.01); G06F 13/22 (2006.01);
U.S. Cl.
CPC ...
G06F 13/362 (2013.01); G06F 13/22 (2013.01);
Abstract

One embodiment relates to a data detection and event capture circuit. Data comparator logic receives a monitored data word from a parallel data bus and generates a plurality of pattern detected signals. Any pattern detection logic receives the plurality of pattern detected signals and generates a plurality of any pattern detected signals. Sequence detection logic receives the plurality of pattern detected signals and generates a plurality of sequence detected signals. Another embodiment relates to a method of data detection and event capture. Another embodiment relates to an integrated circuit having a first data detection and event capture circuit in a receiver circuit and a second data detection and event capture circuit in a transmitter circuit. Other embodiments and features are also disclosed.


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