The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Oct. 31, 2016
International Business Machines Corporation, Armonk, NY (US);
Lukasz Grzegorz Cmielowski, Cracow, PL;
Tymoteusz Gedliczka, Cracow, PL;
Andrzej Jan Wrobel, Cracow, PL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
The disclosure provides an approach for automatically analyzing data related to software development, such as the number of defects, number of code line changes, number of test cases covering code, etc., and creating exploratory tests based on tour templates. In one embodiment, a test generating application matches descriptions, tags and/or keywords in the tour templates with data from development tools used to develop and test software. The test generating application combines the tour templates with the matching data to create exploratory tests for testers to perform. In addition, the test generating application may rank the created tests based on a measure of importance and determine a number of highest ranking tests or test types that can be executed given a capacity of the software tester or testing team. The highest ranking tests may then be provided to the software tester or testing team to perform prior to the software's release.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile