The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Jul. 12, 2017
Vinay Ramanath, Karnataka, IN;
Asmi Rizvi Khaleeli, Karnataka, IN;
Gaurav Hegde, Karnataka, IN;
Siemens Aktiengesellschaft, München, DE;
Abstract
A system, device, and method of deviation detection in at least one sensor dataset associated with one or more sensors in a technical system are provided. The method includes generating a best fit model of the technical system based on a target sensor dataset. The method also includes predicting a sensor dataset of the target sensor using the best fit model and non-target sensor datasets of non-target sensors, and determining a deviation tolerance by determining a difference between the predicted sensor dataset and the target sensor dataset. The method also includes detecting deviation in actual sensor dataset of the target sensor when a data-point in the actual sensor dataset exceeds the deviation tolerance and detecting deviation in the at least one sensor dataset of the one or more sensors by detecting deviation in each of the non-target sensor datasets.