The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Dec. 07, 2015
Applicant:

Paradigm Sciences Ltd., Grand Cayman, KY;

Inventors:

Zvi Koren, Ra'anana, IL;

Allon Bartana, Moshav Mata, IL;

Igor Ravve, Houston, TX (US);

Assignee:

Emerson Paradigm Holding LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); G01V 1/36 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/36 (2013.01); G01V 1/282 (2013.01); G01V 1/301 (2013.01); G01V 1/305 (2013.01); G01V 2210/50 (2013.01); G01V 2210/6222 (2013.01); G01V 2210/64 (2013.01); G01V 2210/66 (2013.01); G01V 2210/671 (2013.01);
Abstract

A system and method for modeling seismic data using time preserving tomography including storing an initial set of parameter values representing an initial seismic data model. The initial seismic model may correspond to at least two or more ray pairs. Each ray pair may have a traveltime. An altered model may be generated by altering two or more parameter values in the initial set of parameter values for each of two or more ray pairs in the initial model. Altering one parameter value without altering the remaining of the two or more parameter values may correspond to a change in the traveltime of each of the ray pairs, while altering the two or more parameter values in combination typically corresponds to no net change in the traveltime of each of the ray pairs.


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