The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Sep. 01, 2016
Applicant:

National University Corporation Hokkaido University, Sapporo-shi, Hokkaido, JP;

Inventors:

Masayori Ishikawa, Sapporo, JP;

Ryo Ogawara, Sapporo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01T 1/202 (2006.01); G01T 1/29 (2006.01); G01T 1/208 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2018 (2013.01); G01T 1/208 (2013.01); G01T 1/2008 (2013.01); G01T 1/2023 (2013.01); G01T 1/2985 (2013.01);
Abstract

A scintillation light detecting device distinguishes between signals from scintillator elements. The device includes a scintillator array. In the scintillator array, the scintillator elements have mutually different decay time constants for emitted light generated as a result of an incident radiation event. A photomultiplier tube that receives light output from the scintillator elements and converts the light into an electrical signal. In relation to the event, an arithmetic processing device detects a peak value and an integrated charge quantity in a voltage waveform of the electrical signal from the photomultiplier tube, and identifies the scintillator element in the scintillator array to which the electrical signal, resulting from the incidence of radiation onto the scintillator element, is attributable, in accordance with a ratio between the detected peak value and integrated electric charge quantity.


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