The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Dec. 02, 2015
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventors:

Roger Derek West, Albuquerque, NM (US);

Mary M. Moya, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01S 13/90 (2013.01);
Abstract

Described herein are various technologies relating to generating a reduced bias multi-resolution (RBMR) coherent change detection (CCD) image product. A low bias, low resolution (LBLR) CCD image product is generated based upon a first SAR image of a scene and a second SAR image of the scene, where each pixel in the LBLR CCD image has a respective value that is computed using a large box-filter. The LBLR CCD image is segmented into a plurality of segments, and a box-filter size is determined for each segment based upon values of pixels in the segment. A RBMR CCD image product is then computed using box-filters of the determined sizes.


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West, Roger. (2019). Reduced-bias multi-resolution coherent change detection (U.S. Patent No. 10345440). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10345440

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