The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Mar. 07, 2016
Applicant:

The Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventor:

Jean-Pierre Leburton, Urbana, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 33/487 (2006.01); G01N 30/88 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48721 (2013.01); G01N 27/447 (2013.01); G01N 27/4473 (2013.01); G01N 2030/8827 (2013.01);
Abstract

Aspects of the subject disclosure may include, for example, an apparatus having a material having a through-hole, a gate coupled to the material for controlling a charge concentration of the material, a sensor, and a controller coupled to the material, the gate and the sensor. The controller can perform operations including applying a first voltage potential to the material to induce a flow of current in the material, applying a second voltage potential to the gate to adjust the charge concentration of the material, and receiving sensing data from the sensor responsive to a change in electrical properties of the material caused by a target traversing the first through-hole of the material. The through-hole causes a plurality of structural portions of the target to be misaligned with a direction of the flow current in the material. Additional embodiments are disclosed.


Find Patent Forward Citations

Leburton, Jean-Pierre. (2019). Method and apparatus for analyzing a target material (U.S. Patent No. 10345289). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10345289

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…