The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Mar. 10, 2017
Applicants:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Kyoto University, Kyoto-shi, Kyoto, JP;
Inventors:
Assignees:
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
KYOTO UNIVERSITY, Kyoto-shi, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/06 (2006.01); G01N 29/14 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4463 (2013.01); G01N 29/043 (2013.01); G01N 29/045 (2013.01); G01N 29/069 (2013.01); G01N 29/14 (2013.01); G01N 29/2437 (2013.01); G01N 29/2475 (2013.01); G01N 2291/0232 (2013.01); G01N 2291/0258 (2013.01); G01N 2291/0289 (2013.01);
Abstract
According to an embodiment, a structure evaluation system includes a plurality of sensors, a position locator, and an evaluator. The sensors detect an elastic wave generated from a structure. The position locator derives a source distribution of the elastic waves generated from the structure, caused by an impact on the structure. The evaluator evaluates a state of deterioration of the structure from characteristic parameters of the elastic waves in the source distribution.