The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Jun. 07, 2013
Nuclear Fuel Industries, Limited, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Junji Etoh, Sennan-gun, JP;
Mitsuyuki Sagisaka, Sennan-gun, JP;
Yoshihiro Isobe, Sennan-gun, JP;
Taira Okita, Tokyo, JP;
NUCLEAR FUEL INDUSTRIES, LIMITED, Tokyo, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
Provided is a material diagnostic method capable measuring and diagnosing in a nondestructive manner the type, quantity of occurrence, depth distribution, and the like of even very small microstructures of about several tens of μm or less with sufficiently good precision. A material diagnostic method for using ultrasonic waves in a nondestructive manner to diagnose microstructures generated in a material, wherein changes in the scattering of ultrasonic waves by crystal grains are captured from bottom face waves and backscattered waves to thereby quantify the amount of change in microstructures, using the fact that changes in the properties of crystal grains produced by microstructures affect the scattering of ultrasonic waves.