The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Dec. 15, 2017
Applicant:

The United States of America, As Represented BY the Secretary of Commerce, Washington, DC (US);

Inventors:

Terrence J. Jach, Washington, DC (US);

Stephen M. Thurgate, Kardinya, AU;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/20033 (2018.01); G01K 7/00 (2006.01); H01J 37/244 (2006.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/20033 (2013.01); G01K 7/006 (2013.01); G01N 23/083 (2013.01); H01J 37/244 (2013.01);
Abstract

An x-ray spectrometer system includes: an excitation source that produces excitation particles and irradiates a sample with the excitation particles such that the sample produces x-rays; thermal detectors that: detect the x-rays from the sample; and produce digital x-ray data in response to detecting the x-rays from the sample, the x-ray data including x-ray pulses; and an analyzer that includes a multichannel receiver that receives, in parallel, the digital x-ray data from the thermal detectors and that: rejects pulse pileup in the digital x-ray data and produces pass data from the digital x-ray data; subjects the pass data to an optimal filter to produce filter data; determines a pulse height of x-ray pulses in the filter data to produce pulse data; combines the pulse data to produce combined data; and calibrates the combined data to produce calibrated data.


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