The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Sep. 06, 2017
Applicant:
Stek Co., Ltd, Taichung, TW;
Inventor:
Ming-Sheng Chen, Taichung, TW;
Assignee:
STEK CO. LTD, Taichung, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/89 (2006.01); G01N 21/896 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01N 21/8806 (2013.01); G01N 21/8901 (2013.01); G01N 21/896 (2013.01);
Abstract
An optical system for inspecting a transparent plate includes a light source for casting incident light onto a face of the transparent plate so that there is a primary reflected light and secondary reflected light from the face of the transparent plate, a photo sensor for receiving light from the face of the transparent plate, and a blocking element for blocking the secondary reflected light while allowing the primary reflected light to reach the photo sensor.
Chen, Ming-Sheng. (2019). Optical system and method for inspecting a transparent plate (U.S. Patent No. 10345248). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10345248
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