The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Nov. 29, 2016
Applicant:

Centre National DE LA Recherche Scientifique (Cnrs), Paris, FR;

Inventors:

Emmanuel Fort, Cachan, FR;

Sandrine Leveque Fort, Cachan, FR;

Karla Balaa, Saint Mande, FR;

Thomas Barroca, Villejuif, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/33 (2006.01); G02B 5/00 (2006.01); G02B 21/16 (2006.01); H04N 5/232 (2006.01); H04N 5/265 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/648 (2013.01); G02B 5/005 (2013.01); G02B 21/0088 (2013.01); G02B 21/16 (2013.01); G02B 21/33 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01); H04N 5/23232 (2013.01); H04N 5/265 (2013.01); G01N 2021/6465 (2013.01); G01N 2201/12 (2013.01);
Abstract

Method for observing an emission of light () from a sample () in a medium () of refractive index ndisposed against a surface () of a transparent support () of refractive index n, greater than n, the emission of light comprising luminous components oriented toward the support and forming an angle θ with a direction () perpendicular to the surface (), said components including supercritical luminous components and critical or subcritical luminous components, the method implementing an observation device () capable of collecting at least part of the emission of light, of applying filters () to the luminous signal collected; and of transforming the filtered luminous signal into an image zone of the sample (); the method being characterized in that:


Find Patent Forward Citations

Fort, Emmanuel. (2019). Method of observing the emission of light from a sample by dynamic optical microscopy (U.S. Patent No. 10345241). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10345241

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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