The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Aug. 14, 2017
Applicant:

New York University, New York, NY (US);

Inventors:

Nikhil Gupta, Ossining, NY (US);

Steven E. Zeltmann, Brooklyn, NY (US);

Assignee:

NEW YORK UNIVERSITY, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/18 (2006.01); G01N 3/32 (2006.01); G01N 33/44 (2006.01);
U.S. Cl.
CPC ...
G01N 3/18 (2013.01); G01N 3/32 (2013.01); G01N 33/442 (2013.01); G01N 2203/0005 (2013.01); G01N 2203/0224 (2013.01); G01N 2203/0226 (2013.01);
Abstract

A method for predicting an elastic modulus of a material includes providing a sample in a dynamic mechanical analysis device, performing a temperature sweep test to obtain a first data set, performing a frequency sweep test to obtain a second data set, using the second data set to generate a master curve in a frequency domain of the at least one of the storage modulus of the sample or the loss modulus of the sample using time-temperature superposition, converting the master curve in the frequency domain into a time domain relaxation function, and using the time domain relaxation function to predict the elastic modulus of the material.


Find Patent Forward Citations

Gupta, Nikhil. (2019). Method to estimate strain rate dependent elastic modulus of materials using dynamic mechanical analysis data (U.S. Patent No. 10345210). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10345210

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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