The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Aug. 01, 2017
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Kailash Kiran Patalay, Santa Clara, CA (US);

Aaron Muir Hunter, Santa Cruz, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01K 1/00 (2006.01); G01K 13/00 (2006.01); G01J 5/10 (2006.01); H01L 21/67 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G01J 5/10 (2013.01); H01L 21/67115 (2013.01); H01L 21/67248 (2013.01); G01J 2005/0048 (2013.01);
Abstract

The embodiments described herein generally relate to systems for noise compensation for proper temperature detection in thermal processing chambers and devices for achieving the same. In one embodiment, a system is disclosed herein. The system includes a processing chamber, a substrate, a pyrometer, and a controller. The processing chamber is configured to process a substrate. The substrate support is disposed in the processing chamber. The pyrometer is positioned to receive radiation emitted by a substrate or a component of the processing chamber and generating a pyrometer signal indicative of the received radiation. The controller is configured to subtract a time invariant noise component and a time variant noise component from the pyrometer signal during processing of a substrate.


Find Patent Forward Citations

Loading…