The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Jul. 11, 2016
Applicant:

Graduate School AT Shenzhen, Tsinghua University, Shenzhen, Guangdong, CN;

Inventors:

Kai Ni, Guangdong, CN;

Qian Zhou, Guangdong, CN;

Jinchao Pang, Guangdong, CN;

Jinchao Zhang, Guangdong, CN;

Rui Tian, Guangdong, CN;

Mingfei Xu, Guangdong, CN;

Hao Dong, Guangdong, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G01J 3/18 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G01J 3/28 (2013.01); G01J 2003/1842 (2013.01);
Abstract

A design method of a spectrometer and a spectrometer are disclosed, including the following steps: 1) determining an incident angle of a second incident slit and a groove-shaped cycle of a concave grating; 2) estimating a blaze angle of the concave grating, determining a surface material and a groove-shaped structure of the concave grating; 3) acquiring wavelength-diffraction efficiency curves; 4) determining values of incident angles θand θand values of wavelengths λand λ, and setting λto equal λ; 5) acquiring a record structural parameter and a use structural parameter; 6) determining a manufacture parameter of the concave grating; 7) determining locations of the three incident slits and the three photodetectors relative to the concave grating. The spectrometer acquired by using this method has relatively high diffraction efficiency in most spectrum regions and effectively alleviates the problem of relatively low diffraction efficiency in a broad spectrum region.


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