The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Jun. 07, 2015
Illinois Tool Works Inc., Glenview, IL (US);
Roy D. Allen, North Andover, MA (US);
ILLINOIS TOOL WORKS INC., Glenview, IL (US);
Abstract
This disclosure presents a method of measuring the strain response of a test material remotely by optical devices using a thin multi-layer assembly, called an optical strain gauge, which is attached directly to the test specimen by pair of adhesive patches built into the assembly. The optical strain gauge assembly attaches quickly and easily by just pressing it onto the specimen by virtue of the two pressure-activated adhesive patches. There is typically no surface preparation necessary for the test specimen. The spatial separation between the two patches adhered to the specimen surface serves to establish an initial gauge length for calculating strain by measuring the stress induced changes to this separation when a load is applied to the test specimen.