The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Jun. 22, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Darryl Brian Price, Cincinnati, OH (US);

Mitchell Donald Smith, Morrow, OH (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F01D 17/16 (2006.01); F01D 21/00 (2006.01); G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
F01D 17/16 (2013.01); F01D 21/003 (2013.01); G05B 13/021 (2013.01); G05B 13/026 (2013.01); F05D 2220/32 (2013.01); F05D 2240/12 (2013.01); F05D 2270/44 (2013.01); F05D 2270/54 (2013.01);
Abstract

A method and system of scheduling a demand for a process inner loop are provided. The loop controller includes an inner loop control system configured to generate a control output signal for a controllable member and a schedule demand module configured to receive parameter values for a controlled variable of a process from a parameter source and to generate a scheduled demand output using a demand schedule. The loop controller also includes a schedule prediction module configured to predict a future value of a scheduling parameter based on a historical performance of the inner loop control system and current system dynamics and to generate a scheduled rate output. The schedule prediction module includes the rate-of-change of a scheduling parameter and a lead time input that defines a look-ahead time period used with the parameter rate signal to determine a future predicted value of the controlled variable.


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