The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Oct. 02, 2017
Applicant:

Consolidated Edison Company of New York, Inc., New York, NY (US);

Inventors:

Troy David De Vries, Mahwah, NJ (US);

Zhou Zheng, Brooklyn, NY (US);

Stanley J. Lewis, Garden City, NY (US);

Leslie George Philp, Pelham, NY (US);

Colleen Bridget Murach, Red Bank, NJ (US);

Gregg L. Slintak, Monroe, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E02D 29/14 (2006.01); E05F 15/60 (2015.01);
U.S. Cl.
CPC ...
E02D 29/14 (2013.01); E02D 29/1472 (2013.01); E02D 29/1481 (2013.01); E02D 29/1427 (2013.01); E05F 15/60 (2015.01);
Abstract

A system for monitoring a structures containing utility components is provided. The system includes a sensing devices, each being disposed within a structure and distributed within a geographic region, each of the sensing devices measuring parameters within the structure. A display is coupled to the sensing devices and is positioned remotely therefrom. One or more processors communicate with the sensing devices and the display. Wherein the processors perform a method comprising: receiving the measured parameters; comparing the measured parameters to thresholds; displaying on the display device elements, each device element representing one of the sensing devices, each of the device elements being geometrically arranged on the geographic distribution of the sensing devices; displaying on the display a plurality of elements, each associated with one of the device elements; and changing at least one of the elements when a measured parameter crossing one of the thresholds.


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