The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Oct. 30, 2015
Applicant:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Inventors:

Hsue-Yang Liu, Vancouver, WA (US);

Luke P. Sosnowski, Vancouver, WA (US);

Mark H. Mackenzie, Vancouver, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); B41J 2/175 (2006.01); B41J 11/00 (2006.01); B41J 13/00 (2006.01); B41J 13/03 (2006.01);
U.S. Cl.
CPC ...
B41J 29/38 (2013.01); B41J 2/175 (2013.01); B41J 11/0095 (2013.01); B41J 13/0009 (2013.01); B41J 13/03 (2013.01);
Abstract

A skew sensor calibration unit including a scanner providing a scanned image of a sheet as the sheet is conveyed along a transport path, the scanned image including a leading edge of the sheet and a skew detection pattern printed thereon by a printhead. A calibration module measures a top skew of the sheet based on position signals from a plurality of skew sensors indicating a position of a leading edge of a sheet as the sheet is conveyed along the transport path, measure an image skew of the sheet relative to the printhead based on the scanned image, and generates a calibration factor that when applied to the measured top skew provides a calibrated top skew that matches the image skew.


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