The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Jul. 27, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jaemin Kang, Seoul, KR;

Yongjoo Kwon, Yongin-si, KR;

Sunkwon Kim, Suwon-si, KR;

Younho Kim, Hwaseong-si, KR;

Sangyun Park, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/0215 (2006.01); A61B 5/021 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7278 (2013.01); A61B 5/02154 (2013.01); A61B 5/02108 (2013.01); A61B 2503/10 (2013.01);
Abstract

A biometric information measuring device includes a pulse wave measuring module configured to measure pulse waves by emitting light toward a target object and sensing light reflected from the target object; a communication module configured to obtain calibration information from a remote calibration server; and a biometric information analyzing module configured to analyze biometric information based on the measured pulse waves and the calibration information. The calibration information indicates biometric information measurement variables of a plurality of subjects.


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