The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Nov. 07, 2018
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Tomonori Kubota, Kawasaki, JP;
Yasuyuki Murata, Shizuoka, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An apparatus obtains a second straight-line by mapping a first straight-line passing a projection center of a target-image taken by a first imaging-device in a three-dimensional space and a point representing an object in a projection-plane of the first imaging-device, onto each of reference-images respectively taken by second imaging-devices, and generates a line-segment representing an existing-range of the object on the second straight-line for each reference-image. The apparatus stores the coordinate-value of the second-endpoint and a difference between coordinate-values of the first-endpoint and a second-endpoint of the line-segment in a memory. The apparatus restores the coordinate-value of the first-endpoint from the coordinate-value of the second-endpoint and the difference stored in the memory, maps the coordinate-values of the endpoints, onto a depth-direction line of the projection plane of the first imaging-device, and determines overlap of the line-segments on the depth-direction line, based on the mapped coordinate-values.