The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Nov. 20, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Albrecht Johannes Lindner, La Jolla, CA (US);

Kalin Mitkov Atanassov, San Diego, CA (US);

Stephen Michael Verrall, Carlsbad, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01); G06T 7/30 (2017.01); G06T 7/593 (2017.01); H04N 13/00 (2018.01); H04N 5/232 (2006.01); H04N 13/128 (2018.01);
U.S. Cl.
CPC ...
H04N 13/128 (2018.05); G06T 5/001 (2013.01); G06T 5/50 (2013.01); G06T 7/0002 (2013.01); G06T 7/30 (2017.01); G06T 7/593 (2017.01); H04N 5/23258 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20182 (2013.01); H04N 2013/0081 (2013.01);
Abstract

An electronic device for generating a corrected depth map is described. The electronic device includes a processor. The processor is configured to obtain a first depth map. The first depth map includes first depth information of a first portion of a scene sampled by the depth sensor at a first sampling. The processor is also configured to obtain a second depth map. The second depth map includes second depth information of a second portion of the scene sampled by the depth sensor at a second sampling. The processor is additionally configured to obtain displacement information indicative of a displacement of the depth sensor between the first sampling and the second sampling. The processor is also configured to generate a corrected depth map by correcting erroneous depth information based on the first depth information, the second depth information, and the displacement information.


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