The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
May. 21, 2018
Grundium Oy, Tampere, FI;
Matti Pellikka, Lempäälä, FI;
Markus Vartiainen, Tampere, FI;
GRUNDIUM OY, Tampere, FI;
Abstract
A method for focusing may include receiving a first image stack of a first field of view, the first image stack including images captured with different focus from the first field of view; determining, from the first image stack, a first spatial distribution of focus depths in which different areas in the first field of view are in focus; determining a first local sample thickness and a first sample tilt in the first field of view based on the first spatial distribution of focus depths; and estimating, based on the first local sample thickness and the first sample tilt, a focus setting for capturing a second image stack from a second field of view.