The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Aug. 20, 2015
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Kyoji Shibutani, Kanagawa, JP;

Takanori Isobe, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04L 9/06 (2006.01); G09C 1/00 (2006.01); G09C 1/04 (2006.01);
U.S. Cl.
CPC ...
H04L 9/0631 (2013.01); G09C 1/00 (2013.01); G09C 1/04 (2013.01); H04L 9/0637 (2013.01); H04L 9/0625 (2013.01);
Abstract

A cipher processing configuration, of which the resistance against various attacks is improved, having a high security level is realized. In a cipher processing configuration in which a nonlinear transformation process and a linear transformation process are repeatedly performed for state data formed from a plurality of elements, a linear transformation unit performs a matrix operation applying a quasi-MDS matrix and a substitution process. As the substitution process, a substitution process is performed which satisfies the following (Condition 1) and (Condition A). (Condition 1) According to the substitution process of the substitution unit for the input X, each column element of the output Y is configured by elements of four mutually-different columns of the input X (Condition A) In a case where the substitution process performed by the substitution unit for the input X is repeatedly performed continuously twice, each column element of the output Y is configured by elements of three or more mutually-different columns of the input X.


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