The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Sep. 29, 2016
Sandia Corporation, Albuquerque, NM (US);
Mohan Sarovar, Albany, CA (US);
David Farley, Livermore, CA (US);
Daniel B. S. Soh, Pleasanton, CA (US);
Ryan Camacho, Albuquerque, NM (US);
Constantin Brif, Tracy, CA (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
Described herein are various technologies pertaining to detecting tampering of a seal based upon quantum optical communication via a communications channel comprising the seal. A plurality of pulses of light encoded with random data are transmitted on the communications channel, whereupon they are received and their data values measured. The measured data values of the pulses are then compared to the known transmitted data to determine a correlation statistic between the transmitted and received data values. Tampering with the seal can be detected based upon identifying that the correlation statistic has dropped below a threshold non-tampered level of correlation between transmitted and received values.