The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Apr. 23, 2017
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Shin-Ho Oh, Yongin-si, KR;

Woo-Hyun Kang, Suwon-si, KR;

Min-Kyu Kim, Suwon-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 29/52 (2006.01); H03M 13/00 (2006.01); H03M 13/05 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
H03M 13/05 (2013.01); G11C 16/26 (2013.01); G11C 29/52 (2013.01); H03M 13/611 (2013.01);
Abstract

In a method of controlling reclaim of a nonvolatile memory device including a plurality of memory blocks, wherein each of the memory blocks includes a plurality of pages, a recovery read operation is performed on first data using an optimal read voltage determined based on the first data, when the first data includes errors which are not correctable, wherein the first data is read from a first page of a first memory block of the memory blocks, and, when the errors of the first data are corrected after the recovery read operation is performed, whether to perform a reclaim of the first page is determined based on threshold voltage distributions of memory cells of the first page, wherein the memory cells are disposed in a region of interest adjacent to the optimal read voltage.


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