The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Oct. 05, 2017
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Woojoo Lee, Daejeon, KR;

Jae-Jin Lee, Daejeon, KR;

Sukho Lee, Daejeon, KR;

Kyuseung Han, Sejong, KR;

Sang Pil Kim, Sejong, KR;

Young Hwan Bae, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/012 (2006.01); H03K 5/134 (2014.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H03K 5/134 (2014.07); H03K 2005/00143 (2013.01);
Abstract

Provided is a semiconductor device including a target circuit, a monitoring circuit, and a voltage controller. The target circuit includes a transistor. The monitoring circuit is configured to measure a temperature of the target circuit or measure a delay time between an input and an output of the target circuit. The voltage controller is configured to adjust a driving voltage for driving the target circuit or a back-bias voltage for adjusting a threshold voltage of the transistor by referring to at least one of the temperature and the delay time. As the temperature increases, the delay time decreases.


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