The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Jan. 15, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Youngsam Shin, Hwaseong-si, KR;

Wonjong Lee, Seoul, KR;

Seokjoong Hwang, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01);
Abstract

A ray tracing apparatus includes a ray generator and a traversal (TRV)/intersection test (IST) integrator. The ray generator is configured to generate a ray. The TRV/IST integrator is configured to receive the ray, determine one of a ray-node intersection test, an intersection distance test, and a hit point test to be performed based on a state of the ray input thereto, and perform the determined test with respect to the ray. The ray-node intersection test, the intersection distance test, and the hit point test are performed with respect to the ray through same pipeline.


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Shin, Youngsam. (2019). Ray tracing apparatus and method (U.S. Patent No. 10339694). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10339694

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