The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Sep. 29, 2017
Nissan Motor Co., Ltd., Yokohama-shi, Kanagawa, JP;
Hirohisa Shibayama, Kanagawa, JP;
Eiji Shiotani, Kanagawa, JP;
Satoru Sakurai, Kanagawa, JP;
Kiyokazu Sugiyama, Kanagawa, JP;
Akira Shimizu, Kanagawa, JP;
Daisuke Terada, Kanagawa, JP;
Yoshitsugu Noshi, Kanagawa, JP;
Yoshito Utsumi, Kanagawa, JP;
Nissan Motor Co., Ltd., Yokohama-shi, Kanagawa, JP;
Abstract
Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.