The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Mar. 24, 2014
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Anat Parush-Tzur, Be'er Sheva, IL;
Nir Goldschmidt, Herzelia, IL;
Otniel van Handel, Modi'in Eilit, IL;
Arik Sapojnik, Beer Sheva, IL;
Oshry Ben-Harush, Kiryat Gat, IL;
Assaf Natanzon, Tel-Aviv, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Described are techniques that determine cumulative skew curves. A first model is determined that generates a predicted destination cumulative skew curve for a specified data set in a destination data storage system having a destination data movement granularity. The predicted destination cumulative skew curve is predicted by the first model in accordance with one or more inputs including a source cumulative skew curve for the specified data set in a source data storage system that uses a source data movement granularity. The source cumulative skew curve for the specified data set is determined based on observed data. First processing is performed using the first model. The first model generates as an output the predicted destination cumulative skew curve. The first processing includes providing the one or more inputs to the first model. Also described is how to generate the first model.