The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Mar. 16, 2016
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Jianfeng Liu, Beijing, CN;

Xun Shi, Shenzhen, CN;

Huanguo Zhang, Wuhan, CN;

Fei Yan, Wuhan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/30 (2013.01); G06F 21/57 (2013.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 21/30 (2013.01); G06F 9/45558 (2013.01); G06F 21/57 (2013.01); G06F 2009/45587 (2013.01); G06F 2221/034 (2013.01); G06F 2221/2101 (2013.01);
Abstract

A measurement method, an electronic device, and a measurement system where the electronic device reads, from a hardware storage device, running code and running data that are in a running process of a virtual machine manager (VMM), and generates first verification information according to the running code and the running data, and the electronic device stores the first verification information, and transmits, to a trusted data center, log information generated in a process that is from reading, by the electronic device, the running code and the running data to storing, by the electronic device, the first verification information such that the trusted data center measures the electronic device using the first verification information acquired from the electronic device and second verification information generated according to the log information.


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