The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Jun. 22, 2016
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Christine Joanna Barmes, Seattle, WA (US);

Samuel Ytzhak Donnelley, Auburn, WA (US);

James Edward Kinney, Jr., Seattle, WA (US);

Alessya Labzhinova, New York, NY (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/2457 (2019.01); G06Q 30/06 (2012.01); G06N 20/00 (2019.01); G06F 16/9535 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24578 (2019.01); G06F 16/9535 (2019.01); G06N 20/00 (2019.01); G06Q 30/0601 (2013.01);
Abstract

Technology is provided for data set scoring. In one example, a method includes analyzing first and second characteristics of a data set. The first and second characteristics represent a quality of data values in the data set. At least the first characteristic is independent of the data values in the data set. The method further includes assigning a score to the data set based on the first and second characteristics. The data set may be ranked against a plurality of other data sets based on the score. The score of the data set may be provided together with a scoring scale to enable a determination of the quality of the data values based on the score.


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